DOE/LANL Jurisdiction Fire Danger Rating:
Eml Marquee 1920x800 Titan
  1. LANL Home
  2. Engage with LANL
  3. Lab Organizations
  4. Electron Microscopy Lab

ThermoFisher Titan 80-300

Titan

The ThermoFisher Titan 80-300 is an image-aberration corrected analytical S/TEM optimized for ultimate TEM resolution. Equipped with a high-brightness, monochromated electron source, a Gatan Tridiem high-resolution GIF, an EDAX Octane Elite T solid-state x-ray spectrometer, a Gatan OneView IS high-speed camera, and a Gatan STEMx 4D-STEM system. Additionally, the Titan is augmented by a Protochips Axon Synchronicity real-time drift correction system. This overall suite enables multi-modal data acquisition during the study of dynamic processes spanning length scales from several micrometers down to the sub-nm level.

Specs, capabilities:

  • Monochromated, high-brightness Schottky X-FEG electron source
  • Flexible operation at accelerating voltages ranging from 80 to 300 keV
  • TEM point-to-point resolution of 0.08 nm
  • STEM point-to-point resolution of 0.136 nm 
  • Gatan OneView 4k CCD camera with in-situ upgrade enabling high-spatial- and high-temporal-resolution data collection
    • 4K x 4K @ 25 FPS
    • 2K x 2K @ 100 FPS
    • 1K x 1K @ 200 FPS
    • 512 x 512 @ 300 FPS
  • High-angle annular dark field (HAADF), annular dark field (ADF), and bright field (BF) STEM detectors enable flexible imaging conditions
  • Gatan Imaging Filter (GIF) with 2k x 2k CCD for sub-0.2 eV energy-resolution electron energy loss spectrometry (EELS), energy-filtered TEM imaging (EF-TEM) and STEM spectrum imaging.
  • Windowless EDAX Octane Elite T 70 mm2 XEDS system fully integrated within Gatan’s GMS software enabling spatially-resolved, quantitative chemical characterization over a wide range of materials
  • Gatan STEMx 4D-STEM data acquisition system
  • Automated TEM and STEM tomography data collection workflows
  • Lorentz-mode TEM and STEM for magnetic domain analysis
  • Protochips Axon Synchronicity real-time drift correction

Highlighted Techniques:

  • 4D-STEM enables mapping of crystallographic properties at the nanometer-scale, applications include:
    • High-precision strain mapping with patterned probe apertures
    • Automated Crystallographic Orientation Mapping (under development)
    • Differential Phase Contrast (DPC) imaging
  • Monochromated-STEM-EELS enables the mapping of bonding/oxidation states at sub‑nanometer resolution
  • Drift-free, atomic resolution, in situ experimentation
Share

Contact

  • EML Division Office
  • Los Alamos National Laboratory Los Alamos, NM 87545
  • Email