Structure/Property Relations, MST-8
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The scanning probe microscopy teamTeam Leader: Marilyn Hawleys MST-8 hosts a suite of scanning probe microscopes that map surface properties by rastering a solid-state probe very near to a surface. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are the most well-known techniques. In contrast to electron microscopy, these techniques do not use electron optics or high-energy focusing. Current project titles include “A Scaleable Silicon-Based Nuclear Spin Quantum Computer,” for which STM fabrication and characterization techniques are being used to create a solid-state quantum computer, and “Atomic-Level Engineering of Nanostructures and Devices,” in which STM-based lithography is helping to fabricate and characterize nanoelectronic devices. In other work, systematic AFM and mechanical properties studies of the relationship between filler content and cross-linking in polydimethylsiloxane formulations are being used to support modeling efforts. For enhanced surveillance, STM is being used to characterize the structure and electrical properties of oxide coatings and hydride-generated defects in depleted uranium. Team Members Team Leader: Marilyn Hawley
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