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SPM and the Science of Film Growth
The nondestructive nature of scanning probe microscopy and its minimal sample preparation requirements provide the capability to carry out rapid high resolution studies of the surface morphology of thin films. The growth details can be determined from the surface structure – grain size, orientation, growth mode, etc. – and can be correlated with macroscopic properties of the film measured by other techniques. These "structure – property" relationships provide a better understanding of the materials and can help point the way towards improved materials processing techniques or even new materials.
Some examples of thin film projects carried out in LANL’s SPML are shown in the links below.
Colossal Magnetoresistive Oxides
Ferroelectric Oxides
Superconducting Oxides
Thin Film Growth
Magnetic Imaging
Metal Multilayers |
Related Links
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Structure/Property Relations, MST-8