Philips XL30 F Orientation Imaging Microscopy System
This is a dedicated system equipped for orientation imaging using backscattered electron diffraction patterns.
- Small, stable, high-brightness Schottky-based field emission electron source provides 2 nm resolution at 30 kV.
- Capable of operating from 1-30 kV.
- Large specimen chamber.
- Digital image acquisition.
- TSL/EDAX orientation imaging CCD camera system for collecting and analyzing EBSD patterns to determine sample phases, orientation distributions, textures, twins and grain boundaries, grain size distributions, etc.