JEOL 6300FXV High Resolution SEM
This is a general purpose SEM equipped for x-ray microanalysis
- Small, high-brightness field emission electron source provides
1.5 nm resolution at 30 kV.
- Capable of operating from 1-30 kV.
- Large specimen chamber with airlock for rapid sample insertion.
- EDAX Energy-dispersive x-ray spectrometer, with point analysis, line scan,
and limited mapping.
- Imaging with both secondary and backscattered electrons.
- Digital image acquisition.