JEOL 3000F High Resolution Transmission Electron Microscope

This is a high-resolution TEM equipped with an electron energy-loss spectrometer and a CCD camera
for digital image acquisition. This microscope is used primarily for imaging the atomic structure of defects and interfaces in materials.

• Field emission electron source. Coherent source with an energy spread of 0.8 eV.
• Operation at accelerating voltages of up to 300 kV.
• +/- 10° of eucentric specimen tilt.
• Point to point resolution of 0.17 nm; 0.10 nm resolution can be extracted by computer processing.
• Gatan Multiscan CCD Camera for digital image acquisition.
• Automated microscope alignment: defocus calibration/adjustment, astigmatism correction and beam-tilt correction (automatic coma-free alignment).
• Gatan Digi-PEELS System for elemental microanalysis.