JEOL 840 EPMA with Wavelength Dispersive Spectroscopy
This is a SEM fitted with three wavelength spectrometers and a total of
eight crystals, covering the periodic table from beryllium to uranium.
With appropriate standards quantitative measurements can be obtained
on both light and heavy elements. Superior energy resolution and signal
to background gives this quantitative technique an advantage over EDS.
There is also greater flexibility in choice of standards and ZAF correction schemes.
- Digital Mapping and Imaging.
- Automated Stage capable of 1 micron steps.
- Geller Microscopy Wavelength Spectroscopy Analysis System.
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